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AMSER-FF: Area-Minimized Soft-Error-Recoverable Flip-Flop for Radiation Hardening.

John Z.-L. TangDave Y.-W. LinRalf E.-H. YeeCharles H.-P. Wen
Published in: ITC-Asia (2021)
Keyphrases
  • error rate
  • infrared
  • x ray
  • flip flops
  • multiple input
  • case study
  • heuristic search
  • real time
  • neural network
  • digital images
  • initial state