Improving IoT Module Testability with Test-Driven Development and Machine Learning.
Victor Takashi HayashiCairo Mateus Neves RibeiroArtino Quintino FilhoMatheus Ancelmo Bonfim PitaBruno Manias TrazziJúlio Cezar EstrellaWilson Vicente RuggieroPublished in: FiCloud (2021)
Keyphrases
- machine learning
- test driven development
- management system
- software development
- machine learning methods
- decision trees
- knowledge discovery
- inductive learning
- reinforcement learning
- learning algorithm
- machine learning algorithms
- data mining
- text mining
- learning problems
- learning tasks
- natural language processing
- learning systems
- computational biology
- cloud computing
- explanation based learning
- pattern recognition
- computer vision
- artificial intelligence
- neural network
- computational intelligence
- real time
- text classification
- knowledge acquisition
- information extraction
- knowledge representation
- computer science
- feature selection
- machine learning approaches
- databases
- machine learning and data mining
- data sets