Integrating Maximum Deviation Method and VIKOR for Evaluating Enterprise Performance in Semiconductor Industry.
Cheng-Yen ChenPublished in: IEEM (2019)
Keyphrases
- detection method
- high precision
- cost function
- high accuracy
- classification method
- theoretical analysis
- information management
- optimization method
- optimization algorithm
- computationally efficient
- computational cost
- preprocessing
- case study
- support vector machine
- dynamic programming
- evolutionary algorithm
- information technology
- main contribution
- support vector machine svm
- clustering method
- support vector
- synthetic data
- similarity measure
- image processing
- information systems