Process diagnostics using trace alignment: Opportunities, issues, and challenges.

R. P. Jagadeesh Chandra Bose Wil M. P. van der Aalst

Published in: Inf. Syst. (2012)

Keyphrases

key issues
technical challenges
practical issues
real time
decision trees
diagnostic process
neural network
real world
decision making
knowledge base
bayesian networks
open issues