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Classification of the Motion Artifacts in Near-infrared Spectroscopy Based on Wavelet Statistical Feature.

Seung-Bo LeeHakseung KimSeho LeeHyun-Ji KimSeong-Whan LeeDong-Joo Kim
Published in: SMC (2019)
Keyphrases
  • feature vectors
  • feature extraction
  • multiscale
  • multiresolution
  • wavelet transform
  • image data
  • statistical analysis
  • motion artifacts
  • denoising
  • image compression