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Classification of the Motion Artifacts in Near-infrared Spectroscopy Based on Wavelet Statistical Feature.
Seung-Bo Lee
Hakseung Kim
Seho Lee
Hyun-Ji Kim
Seong-Whan Lee
Dong-Joo Kim
Published in:
SMC (2019)
Keyphrases
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feature vectors
feature extraction
multiscale
multiresolution
wavelet transform
image data
statistical analysis
motion artifacts
denoising
image compression