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Semi-modularity and testability of speed-independent circuits.

Peter A. BeerelTeresa H.-Y. Meng
Published in: Integr. (1992)
Keyphrases
  • high speed
  • real time
  • processing speed
  • neural network
  • case study
  • database systems
  • social network analysis
  • asynchronous circuits
  • test data generation
  • delay insensitive