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A Goodness of Fit Test for the Multilevel Logistic Model.

A. A. P. N. M. PereraM. R. SooriyarachchiShanika L. Wickramasuriya
Published in: Commun. Stat. Simul. Comput. (2016)
Keyphrases
  • logistic model
  • logistic regression
  • neural network
  • high quality
  • pattern recognition
  • learning algorithm
  • image processing
  • image segmentation
  • active learning
  • naive bayes
  • loss function