Login / Signup
Use of the Japio Technical Field Dictionaries for NTCIR-PatentMT.
Tadaaki Oshio
Tomoharu Mitsuhashi
Tsuyoshi Kakita
Published in:
NTCIR (2011)
Keyphrases
</>
test collection
machine learning
sparse representation
neural network
information technology
wide variety
evaluation metrics
web retrieval