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Least-Squares Fitting of Two 3-D Point Sets.

K. S. ArunThomas S. HuangSteven D. Blostein
Published in: IEEE Trans. Pattern Anal. Mach. Intell. (1987)
Keyphrases
  • point sets
  • affine registration
  • data sets
  • database systems
  • multiscale
  • pattern recognition
  • viewpoint
  • search space
  • query processing
  • special case