Application of the simulated annealing local search technique to problems of redundancy elimination in functional and parametric tests of integrated circuits.
Wolfgang MergenthalerBernhard MauersbergJens FellerL. J. StuehlerW. T. O'GradyJ. S. LedfordPublished in: Math. Comput. Simul. (2003)
Keyphrases
- simulated annealing
- integrated circuit
- benchmark problems
- neighborhood search
- genetic algorithm
- evolutionary algorithm
- tabu search
- combinatorial optimization
- metaheuristic
- search procedure
- data sets
- multi objective
- optimization problems
- particle swarm optimization pso
- search methods
- efficient implementation
- search space
- search algorithm
- stochastic search