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The impact of heat loss paths on the electrothermal models of self-heating effects in nanoscale tri-gate SOI MOSFETs.

Yali SuJunhua LaiFeng Liang
Published in: IEICE Electron. Express (2018)
Keyphrases
  • probabilistic model
  • machine learning
  • learning algorithm
  • parameter estimation
  • negative effects
  • negative impact