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Mitigate erroneous operations of 2T-2MTJ STT-MRAM based on dynamic voltage threshold.

Haoyue TangZhenyu ZhaoLianhua QuQuan DengHuan LiWei Guo
Published in: IEICE Electron. Express (2016)
Keyphrases
  • design considerations
  • dynamic environments
  • insertions and deletions
  • real time
  • data sets
  • information retrieval
  • data structure
  • roc curve
  • power supply