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The effect of atomic layer deposition temperature on switching properties of HfOx resistive RAM devices.

Katrina A. MorganRuomeng HuangStuart PearceC. H. De Groot
Published in: ISCAS (2014)
Keyphrases
  • permalloy films
  • mobile devices
  • database
  • real time
  • desirable properties
  • database systems
  • structural properties
  • personal computer
  • multi layer
  • application layer