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2D Label Free Microscopy Imaging Analysis Using Machine Learning.
Han Hu
Yang Lei
Daisy Xin
Viktor Shkolnikov
Steven Barcelo
Jan P. Allebach
Edward J. Delp
Published in:
Computational Imaging (2020)
Keyphrases
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machine learning
data analysis
statistical analysis
genetic algorithm
pattern recognition
image analysis
database
search engine
feature selection
computational intelligence
microscopy imaging
knowledge acquisition
supervised machine learning