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Multi-Target Defect Identification for Railway Track Line Based on Image Processing and Improved YOLOv3 Model.

Xiukun WeiDehua WeiDa SuoLimin JiaYujie Li
Published in: IEEE Access (2020)
Keyphrases
  • image processing
  • multi target
  • probabilistic model
  • image analysis
  • multi sensor
  • computer vision
  • feature selection
  • multiscale
  • spatio temporal
  • tracking scheme