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An Algorithm to Estimate the Fraction Defective and The Exponential Mean Life Using Unlabeled Samples.

Tze Fen LiSung Wu Chang
Published in: Inf. Process. Lett. (1994)
Keyphrases
  • active learning
  • learning algorithm
  • semi supervised
  • semi supervised learning
  • k means
  • expectation maximization
  • significant improvement
  • incremental learning
  • bayesian networks
  • probabilistic model
  • label propagation