Bistatic Analysis Using the Real Representation Scattering Matrix Eigen-Classification.
Madalina CiucaGabriel VasileAndrei AnghelMichel GaySilviu CiochinaPublished in: IEEE Trans. Geosci. Remote. Sens. (2022)
Keyphrases
- pattern recognition
- decision trees
- pattern analysis
- classification algorithm
- feature vectors
- support vector machine
- supervised learning
- pattern representation
- statistical analysis
- image classification
- data sets
- learning algorithm
- machine learning
- classification accuracy
- text classification
- image analysis
- image representation
- training samples
- pairwise
- feature representation
- robust classification