A Model for Waveform Dissimilarities in Dual-Depth Reflectance-PPG.

Andreia Vieira Moco Sander Stuijk Gerard de Haan Ruikang K. Wang Wim Verkruysse

Published in: EMBC (2018)

Keyphrases

probabilistic model
high level
similarity measure
single image
statistical model
computational model
mathematical model
multiscale
objective function
experimental data