Login / Signup

Study of the breakdown failure mechanisms for power AlGaN/GaN HEMTs implemented using a RF compatible process.

Gang XieEdward XuBo ZhangWai Tung Ng
Published in: Microelectron. Reliab. (2012)
Keyphrases
  • factors affecting
  • study proposes
  • database
  • real time
  • artificial intelligence
  • multiscale
  • theoretical framework
  • simulation study