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Lithography technology for advanced devices and introduction to integrated CAD analysis for hotspot detection.
Abhishek Vikram
Vineeta Agarwal
Anshul Agarwal
Published in:
IET Circuits Devices Syst. (2017)
Keyphrases
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case study
rapid development
statistical analysis
quantitative analysis
false positives
detection method
object detection
image analysis
mobile devices
web services
object oriented
database
anomaly detection
detection algorithm
data analysis
mobile learning
automatic detection
personal computer
neural network