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An Improved Multiphysics Analysis Model for the Short-Circuit Fault Ride-Through Capability Evaluation of the MMC Submodule Busbar.
Yang Cai
Wenyong Guo
Wenju Sang
Fancheng Guo
Chenyu Tian
Suhang Yu
Published in:
IEEE Access (2021)
Keyphrases
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mathematical model
evaluation method
model validation
real time
experimental data
evaluation model
neural network
genetic algorithm
probabilistic model
short circuit