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Machine Learning and Uncertainty Quantification for Surrogate Models of Integrated Devices With a Large Number of Parameters.
Riccardo Trinchero
Mourad Larbi
Hakki Mert Torun
Flavio G. Canavero
Madhavan Swaminathan
Published in:
IEEE Access (2019)
Keyphrases
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machine learning
neural network
learning algorithm
machine learning algorithms
decision trees
small number
pattern recognition
computer vision
information systems
feature selection
maximum likelihood
inductive logic programming