On-wafer measurements of noise temperature.
James RandaRobert L. BillingerJohn L. RicePublished in: IEEE Trans. Instrum. Meas. (1999)
Keyphrases
- measurement noise
- signal to noise ratio
- measurement errors
- measurement error
- random noise
- noise level
- surface temperature
- noise reduction
- semiconductor manufacturing
- noise sensitivity
- image noise
- low snr
- massively parallel
- integrated circuit
- noisy data
- solar radiation
- neural network
- electric field
- background noise
- noise removal