Don't Just Blame Over-parametrization for Over-confidence: Theoretical Analysis of Calibration in Binary Classification.
Yu BaiSong MeiHuan WangCaiming XiongPublished in: ICML (2021)
Keyphrases
- binary classification
- theoretical analysis
- multi class
- learning problems
- support vector
- cost sensitive
- multi class classification
- support vector machine
- prediction accuracy
- multi label
- generalization error
- ensemble methods
- binary classifiers
- class imbalance
- graph cuts
- machine learning algorithms
- class distribution
- benchmark datasets
- higher order
- supervised learning
- reinforcement learning
- image segmentation
- data sets