A self-adaptive class-imbalance TSK neural network with applications to semiconductor defects detection.
Shing Chiang TanShuming WangJunzo WatadaPublished in: Inf. Sci. (2018)
Keyphrases
- class imbalance
- neural network
- class distribution
- fuzzy logic
- active learning
- high dimensionality
- cost sensitive learning
- cost sensitive
- artificial neural networks
- small number
- imbalanced datasets
- sampling methods
- fuzzy rules
- change detection
- imbalanced data
- back propagation
- non stationary
- pattern recognition
- small disjuncts
- minority class
- training samples
- face recognition