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Highly Reliable 40nm Embedded Dual-Interface-Switching RRAM Technology for Display Driver IC Applications.
L. Zhao
Z. Chen
D. Manea
S. Li
J. Li
Y. Zhu
Z. Sui
Z. Lu
Published in:
VLSI Technology and Circuits (2022)
Keyphrases
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highly reliable
cost effective
input device
embedded systems
case study
metal oxide semiconductor
integrated circuit
data processing
web services composition
real time
computer systems
visualization tool
user interface
traffic safety
computer screen
road safety
nm technology
silicon on insulator