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Layout techniques for radiation hardening of standard CMOS active pixel sensors.

Leo Huf Campos BragaSuzana DominguesMilton F. RochaLeonardo Bruno de SáFernando de Souza CamposFilipe V. SantosAntonio Carneiro de Mesquita FilhoMário Vaz SilvaJacobus W. Swart
Published in: SBCCI (2007)
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