An ensemble-based deep semi-supervised learning for the classification of Wafer Bin Maps defect patterns.
Siyamalan ManivannanPublished in: Comput. Ind. Eng. (2022)
Keyphrases
- semi supervised learning
- supervised learning
- improve the classification accuracy
- semi supervised classification
- unlabeled data
- co training
- semi supervised
- unsupervised learning
- uci datasets
- machine learning
- labeled data
- labeled and unlabeled data
- semi supervised learning algorithms
- transductive support vector machine
- training data
- training set
- text categorization
- classification accuracy
- class labels
- text classification
- active learning
- feature selection
- label propagation
- unlabeled samples
- supervised learning algorithms
- manifold regularization
- support vector machine
- feature extraction
- support vector
- transfer learning
- classification models
- labeled instances
- neural network
- graph based semi supervised learning
- feature set
- label information
- pattern recognition
- training samples
- model selection
- classifier ensemble
- data sets
- semi supervised learning methods
- labeled examples
- learning models
- face recognition
- dimension reduction
- learning tasks
- machine learning algorithms
- learning algorithm
- object recognition