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A comprehensive comparative study of clustering-based unsupervised defect prediction models.

Zhou XuLi LiMeng YanJin LiuXiapu LuoJohn GrundyYifeng ZhangXiaohong Zhang
Published in: J. Syst. Softw. (2021)
Keyphrases
  • comparative study
  • probabilistic model
  • neural network
  • statistical models
  • defect prediction
  • information technology
  • prior knowledge
  • complex systems
  • life cycle
  • classification models
  • address these issues