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A Word Line Pulse Circuit Technique for Reliable Magnetoelectric Random Access Memory.
Hochul Lee
Albert Lee
Shaodi Wang
Farbod Ebrahimi
Puneet Gupta
Pedram Khalili Amiri
Kang L. Wang
Published in:
IEEE Trans. Very Large Scale Integr. Syst. (2017)
Keyphrases
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random access memory
low voltage
design considerations
co occurrence
high speed
cmos technology
embedded dram
real time
shift register
main memory
flash memory