Detecting Label Errors in Token Classification Data.
Wei-Chen WangJonas MuellerPublished in: CoRR (2022)
Keyphrases
- data sets
- neural network
- raw data
- computer systems
- database
- original data
- training data
- high quality
- data analysis
- image data
- classification models
- input data
- multi class
- support vector machine
- probability distribution
- data sources
- feature space
- pattern recognition
- knn
- xml documents
- small number
- high dimensional
- data collection
- statistical analysis
- high dimensional data
- decision trees
- learning algorithm
- label information