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Nonsilicon, Non-von Neumann Computing - Part I [Scanning the Issue].

Sankar BasuRandal E. BryantGiovanni De MicheliThomas N. TheisLloyd Whitman
Published in: Proc. IEEE (2019)
Keyphrases
  • von neumann
  • expected utility
  • machine learning
  • expert systems
  • evolutionary algorithm
  • decision theory