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Damage profile model of nanostructure fabricated by Focused Helium Ion Beam.
Chenglong Liu
Qi Li
Qianhuang Chen
Yan Xing
Published in:
NEMS (2021)
Keyphrases
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high level
computational model
objective function
statistical model
conceptual model
cost function
probabilistic model
hierarchical structure
prediction model
neural network
image sequences
multiscale
process model
mathematical model
formal model