Damage profile model of nanostructure fabricated by Focused Helium Ion Beam.

Chenglong Liu Qi Li Qianhuang Chen Yan Xing

Published in: NEMS (2021)

Keyphrases

high level
computational model
objective function
statistical model
conceptual model
cost function
probabilistic model
hierarchical structure
prediction model
neural network
image sequences
multiscale
process model
mathematical model
formal model