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Deep Learning With Customized Abstract Syntax Tree for Bug Localization.

Hongliang LiangLu SunMeilin WangYuxing Yang
Published in: IEEE Access (2019)
Keyphrases
  • deep learning
  • bug localization
  • machine learning
  • unsupervised feature learning
  • unsupervised learning
  • high level
  • natural language
  • mental models
  • face recognition
  • text classification