Login / Signup
Effect of process-induced voids on isothermal fatigue resistance of CSP lead-free solder joints.
Qiang Yu
Tadahiro Shibutani
Do-Seop Kim
Yusuke Kobayashi
Jidong Yang
Masaki Shiratori
Published in:
Microelectron. Reliab. (2008)
Keyphrases
</>
constraint satisfaction problems
constraint satisfaction
data sets
databases
real world
image processing
decision trees