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Detection of Small Defects in Composite Insulators Using Terahertz Technique and Deconvolution Method.

Hongwei MeiHuaiyuan JiangFanghui YinLanxin LiLiming Wang
Published in: IEEE Trans. Instrum. Meas. (2020)
Keyphrases
  • detection method
  • prior knowledge
  • similarity measure
  • pairwise
  • dynamic programming
  • computational cost
  • detection algorithm
  • image processing
  • multiscale
  • computational complexity
  • anomaly detection
  • synthetic data