Developing a spiral scanning method using atomic force microscopy.
HabibullahHemanshu Roy PotaIan R. PetersenPublished in: ASCC (2013)
Keyphrases
- detection method
- high precision
- significant improvement
- experimental evaluation
- high accuracy
- image processing
- error rate
- mathematical model
- computational cost
- cost function
- k means
- dynamic programming
- classification accuracy
- prior knowledge
- segmentation method
- support vector machine svm
- clustering method
- classification method
- fully automatic
- theoretical analysis
- input data
- mutual information
- support vector machine
- objective function
- similarity measure
- decision trees