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Using ECC and redundancy to minimize vmin induced yield loss in 6T SRAM arrays.

Gururaj ShamannaRaja GauravY. K. RaghavendraPercy MarfatiaBhunesh S. Kshatri
Published in: ICICDT (2012)
Keyphrases
  • power consumption
  • minimum redundancy
  • error correction
  • information systems
  • security analysis
  • error propagation
  • image quality
  • information content
  • data transmission
  • elliptic curve cryptography