Substrate noise isolation improvement in a single-well standard CMOS process.

Pedro Mendonça dos Santos Luís Mendes João Caldinhas Vaz

Published in: Integr. (2016)

Keyphrases

noise reduction
noise level
additive noise
data sets
databases
image processing
noisy data
information retrieval
learning algorithm
feature selection
case study
low frequency
estimation error
noise model