A hierarchical ensemble causal structure learning approach for wafer manufacturing.
Yu YangSthitie BomXiaotong ShenPublished in: J. Intell. Manuf. (2024)
Keyphrases
- structure learning
- bayesian networks
- markov blanket
- semiconductor manufacturing
- graphical models
- conditional independence
- bayesian network structure learning
- bayesian network classifiers
- parameter estimation
- parameter learning
- causal discovery
- transfer learning
- causal models
- markov logic networks
- probability distribution
- probabilistic model
- network structure
- markov networks
- wafer fabrication
- conditional probabilities
- causal reasoning
- conditional independence tests
- data sets
- sample size
- naive bayes
- worst case
- feature selection
- model selection
- learning algorithm
- neural network