New Method for Comprehensive Characterisation of MES/MOD/MOS FET's.
Anthony E. ParkerJonathan B. ScottPublished in: ISCAS (1993)
Keyphrases
- prior knowledge
- high accuracy
- high precision
- preprocessing
- pairwise
- synthetic data
- dynamic programming
- error rate
- main contribution
- theoretical analysis
- computer vision
- experimental study
- experimental evaluation
- mathematical model
- classification method
- evaluation method
- d objects
- em algorithm
- probabilistic model
- cost function
- multiscale
- decision trees
- image processing