Fabrication of Nanoslits with Etching TSWE Method.
Hao HongLi YeKe LiPasqualina M. SarroGuoqi ZhangZewen LiuPublished in: NEMS (2021)
Keyphrases
- experimental evaluation
- support vector machine svm
- similarity measure
- fully automatic
- high precision
- pairwise
- high accuracy
- cost function
- mutual information
- error rate
- significant improvement
- prior knowledge
- preprocessing
- main contribution
- probabilistic model
- neural network
- computationally efficient
- theoretical analysis
- optimization algorithm
- detection algorithm
- mathematical model
- support vector
- objective function
- integrated circuit