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Construction of a Model for Discriminating between Electroencephalographic Patterns at the Time of Incorrect Inputs Based on Sensitivity Spectrum Analysis.

Raita OhoriDaiki ShinkaiYoshimitsu NagaiSyohei Ishizu
Published in: HCI (11) (2011)
Keyphrases
  • probabilistic model
  • feature extraction
  • similarity measure
  • bayesian networks
  • objective function
  • cost function
  • higher order
  • maximum entropy