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The device characteristics of missing LDD implantation via nanoprobing techniques for localized failure analysis.
Li-Lung Lai
Xiaojing Wu
Published in:
Microelectron. Reliab. (2015)
Keyphrases
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data analysis
statistical analysis
neural network
information technology
data acquisition
failure detection
databases
website
case study
similarity measure
digital libraries
image analysis
missing values
incomplete data