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A critical note to IEEE 1057-94 standard on hysteretic ADC dynamic testing.
Pasquale Arpaia
António Manuel da Cruz Serra
Conceigio Libano Monteiro
Published in:
IEEE Trans. Instrum. Meas. (2001)
Keyphrases
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dynamic environments
databases
artificial intelligence
real time
machine learning
decision making
image processing
hidden markov models
test set
dynamically changing