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A critical note to IEEE 1057-94 standard on hysteretic ADC dynamic testing.

Pasquale ArpaiaAntónio Manuel da Cruz SerraConceigio Libano Monteiro
Published in: IEEE Trans. Instrum. Meas. (2001)
Keyphrases
  • dynamic environments
  • databases
  • artificial intelligence
  • real time
  • machine learning
  • decision making
  • image processing
  • hidden markov models
  • test set
  • dynamically changing