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Single-event burnout hardening evaluation with current and electric field redistribution of high voltage LDMOS transistors based on TCAD Simulations.

Yibo LeiJian FangYingdong LiangYisen ZhangLing YanLingli TangXihe YangBo Zhang
Published in: Microelectron. J. (2023)
Keyphrases
  • learning algorithm
  • high voltage
  • electric field
  • space charge
  • integrated circuit
  • circuit design
  • data mining
  • numerical simulations
  • normal operation