Dynamic IEEE Test Systems for Transient Analysis.

Panayiotis Demetriou Markos Asprou Jairo Quiros Tortos Elias Kyriakides

Published in: IEEE Syst. J. (2017)

Keyphrases

statistical analysis
hidden markov models
computer systems
building blocks
data sets
neural network
information systems
web services
expert systems
artificial neural networks
wireless sensor networks
intelligent systems