Towards Fast and Semi-supervised Identification of Smart Meters Launching Data Falsification Attacks.
Shameek BhattacharjeeAditya ThakurSajal K. DasPublished in: AsiaCCS (2018)
Keyphrases
- data sets
- semi supervised
- data analysis
- database
- computer systems
- data processing
- data structure
- data points
- labeled data
- data collection
- knowledge discovery
- data sources
- high quality
- probability distribution
- end users
- image data
- training data
- feature selection
- machine learning
- spatial data
- data distribution
- spectral clustering