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Accurate and Fast STT-MRAM Endurance Evaluation Using a Novel Metric for Asymmetric Bipolar Stress and Deep Learning.
Z. Wei
W. Kim
Z. Wang
L. Hu
D. Jung
J. Zhang
Y. Huai
Published in:
VLSI Technology and Circuits (2022)
Keyphrases
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deep learning
unsupervised learning
unsupervised feature learning
information extraction
weakly supervised
decision making
dimensionality reduction
markov random field
design considerations
machine learning
pattern recognition
multi class
semi supervised