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A Novel Single-Probe Setup for Multifrequency Simultaneous Measurement of In-Circuit Impedance.

Arjuna WeerasingheZhenyu ZhaoQuqin SunFei FanPengfei TuWensong WangKye Yak See
Published in: IEEE Trans. Ind. Electron. (2023)
Keyphrases
  • high speed
  • computer vision
  • real time
  • neural network
  • probabilistic model
  • data acquisition